Test and Diagnostics
BASIC DATA
course listing
A - main register
course code
IEE1540
course title in Estonian
Test ja diagnostika
course title in English
Test and Diagnostics
course volume CP
-
ECTS credits
6.00
to be declared
yes
assessment form
Examination
teaching semester
autumn
language of instruction
Estonian
English
Study programmes that contain the course
Structural units teaching the course
IE - Thomas Johann Seebeck Department of Electronics
Course description link
Timetable link
View the timetable
Version:
VERSION SPECIFIC DATA
course aims in Estonian
Anda teoreetilised ja praktilised alused analoog- ja digitaal elektroonika- testi ja diagnostika algoritmidest ja lahendusest.
course aims in English
To give theoretical and practical base for test and diagnostics in analog and digital electronics.
learning outcomes in the course in Est.
Aine läbinud üliõpilane teab põhilisi testi ja diagnostika meetodeid ja oskab valida sobivaid konkreetsete ülesannete puhul.
learning outcomes in the course in Eng.
Having finished the study of the subject a student knows the theoretical and practical aspects of the topic and is able to find appropriate practical solutions as needed.
brief description of the course in Estonian
Elektronaparatuuri ja selle sõlmede vigade avastamise ja lokaliseerimise põhistrateegiad, meetodid ja algoritmid. Testi sügavus ja maksumus. Tänapäevaste testivahendite funktsionaalsed võimalused, töökiiruse ja täpsuse nõuded. Kontaktliidesed. Kontaktitu test (AOI, XOI jm.). Analoog-, digitaal ja seguskeemide diagnostika. Lülituste dekompositsioon, testi optimeerimine. Automatiseeritud testi- ja diagnostikasüsteemid. Test tootmises, tootearendus ja testitavus. Testi tüübid. Testsignaalid ja -vektorid, reaktsioon, testi kriteeriumid. Automaatse testvektorite genereerimine. Scan-test. Sisseehitatud süsteemide test.
brief description of the course in English
Principles, methods and algorithms of testing and diagnosis of faults of electronic devices and components. Depth, coverage and cost of the test. Functionality of modern test equipment, speed and accuracy. Test fixtures. Contactless testing (e.g. AOI, XOI). Diagnostics of analog, digital and mixed circuits. Decomposition of circuits, test optimisation. Automated test equipment (ATE). Test in production, design for testability.Test types. testsignals and vectors, test criterias. Automated generation of test vectors. Test of embedded systems.
type of assessment in Estonian
Teadmiste kontroll toimub eksamil. Üliõpilane peab eksamile pääsemiseks olema sooritanud harjutused-praktikumid. Eksamil kontrollitakse üliõpilase teoreetilisi teadmisi. Eksamihinne kujuneb eksamiküsimuste vastustega saadud alusel. Kokkuleppel õppejõuga võib ainet sooritada osade kaupa semestri jooksul.
type of assessment in English
The control of knowledges takes place in examinations at the end of a term. For the getting a permission to an examination it is necessary to do all hands-on-exercises. In examination the theoretical knowledge is checked. The lecturer has a right to examine students by parts during a term.
independent study in Estonian
Referaat.
independent study in English
Presentation.
study literature
Handbook of testing electronic systems (Ondrej Novák, Elena Gramatová, Raimund Ubar et al), 2005 (395 pp)
study forms and load
daytime study: weekly hours
3.0
session-based study work load (in a semester):
lectures
2.0
lectures
-
practices
1.0
practices
-
exercises
0.0
exercises
-
lecturer in charge
-
LECTURER SYLLABUS INFO
semester of studies
teaching lecturer / unit
language of instruction
Extended syllabus or link to Moodle or to home page
2023/2024 autumn
Olev Märtens, IE - Thomas Johann Seebeck Department of Electronics
English
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    2022/2023 autumn
    Olev Märtens, IE - Thomas Johann Seebeck Department of Electronics
    English
      2021/2022 autumn
      Olev Märtens, IE - Thomas Johann Seebeck Department of Electronics
      English
        IEE1540 Test and Diagnostics assessment criteria.pdf 
        2020/2021 autumn
        Olev Märtens, IE - Thomas Johann Seebeck Department of Electronics
        English
          IEE1540 Test and Diagnostics assessment criteria.pdf 
          2019/2020 autumn
          Olev Märtens, IE - Thomas Johann Seebeck Department of Electronics
          English
            IEE1540 Test and Diagnostics assessment criteria.pdf 
            Course description in Estonian
            Course description in English